Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method - IMT - Institut Mines-Télécom Access content directly
Journal Articles Microelectronics Reliability Year : 2015
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hal-01122423 , version 1 (03-03-2015)

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  • HAL Id : hal-01122423 , version 1

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Ting An, Kaikai Liu, Hao Cai, Lirida Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩
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