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A model to simulate the behaviour of probabilistic gatesJournées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Conference papers
hal-02286894v1
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Reliability analysis of combinational circuits with the influences of noise and single-event transientsIEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States
Conference papers
hal-02286814v1
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Efficient Implementation for Accurate Analysis of CED Circuits Against Multiple Faults21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Conference papers
hal-02286893v1
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Reliability Analysis of a Reed-Solomon DecoderIEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Conference papers
hal-02411876v1
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Efficient reliability evaluation methodologies for combinational circuitsMicroelectronics Reliability, 2016, 64, pp.19-25. ⟨10.1016/j.microrel.2016.07.116⟩
Journal articles
hal-02942489v1
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Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Conference papers
hal-02412061v1
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A General Cost-effective Design Structure for Probabilistic-Based Noise-Tolerant Logic Functions in Nanometer CMOS TechnologyEurocon 2013, Jul 2013, Zagreb, Croatia. pp.1829-1836, ⟨10.1109/EUROCON.2013.6625225⟩
Conference papers
hal-02286855v1
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Structure d'Atténuation de Bruit d'une Fonction Logique CombinatoireFrance, N° de brevet: 1262053. KL:BREVET-12. 2012
Patents
hal-02412524v1
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Efficient Computation of Combinational Circuits Reliability Based on Probabilistic Transfer MatrixInternational Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States
Conference papers
hal-02412060v1
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Analytical method for reliability assessment of concurrent checking circuits under multiple faultsMIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Conference papers
hal-02286867v1
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Efficient reliability evaluation methodologies for combinational circuitsMicroelectronics Reliability, 2016, 64
Journal articles
hal-02287474v1
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Reliability of probabilistic circuitsEngineering Sciences [physics]. TELECOM ParisTech, 2014. English. ⟨NNT : ⟩
Theses
tel-01208121v1
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Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical MethodMicroelectronics Reliability, 2015, 55 (3-4), pp.696-703
Journal articles
hal-01122423v1
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A Study of Statistical Variability-aware MethodsIEEE International Symposium on Radio Frequency Integration Technology (RFIT), Aug 2014, Hefei, China
Conference papers
hal-02286946v1
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