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authFullName_s : Kaikai Liu

A model to simulate the behaviour of probabilistic gates

Kaikai Liu , Lirida Alves de Barros Naviner , Jean-François Naviner
Journées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Conference papers hal-02286894v1

Reliability analysis of combinational circuits with the influences of noise and single-event transients

Kaikai Liu , Hao Cai , Ting An , Lirida Alves de Barros Naviner , Jean-François Naviner , et al.
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States
Conference papers hal-02286814v1

Efficient Implementation for Accurate Analysis of CED Circuits Against Multiple Faults

Ting An , Kaikai Liu , Hao Cai , Lirida Alves de Barros Naviner
21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Conference papers hal-02286893v1

Reliability Analysis of a Reed-Solomon Decoder

Kaikai Liu , Tian Ban , Lirida Alves de Barros Naviner , Jean-François Naviner
IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Conference papers hal-02411876v1

Efficient reliability evaluation methodologies for combinational circuits

Hao Cai , Kaikai Liu , Lirida Alves de Barros Naviner , You Wang , Mariem Slimani , et al.
Microelectronics Reliability, 2016, 64, pp.19-25. ⟨10.1016/j.microrel.2016.07.116⟩
Journal articles hal-02942489v1

Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops

Hao Cai , Kaikai Liu , Lirida Alves de Barros Naviner
21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Conference papers hal-02412061v1

A General Cost-effective Design Structure for Probabilistic-Based Noise-Tolerant Logic Functions in Nanometer CMOS Technology

Kaikai Liu , Ting An , Hao Cai , Lirida Alves de Barros Naviner , Jean-François Naviner , et al.
Eurocon 2013, Jul 2013, Zagreb, Croatia. pp.1829-1836, ⟨10.1109/EUROCON.2013.6625225⟩
Conference papers hal-02286855v1

Structure d'Atténuation de Bruit d'une Fonction Logique Combinatoire

Kaikai Liu , Lirida Alves de Barros Naviner , Jean-François Naviner
France, N° de brevet: 1262053. KL:BREVET-12. 2012
Patents hal-02412524v1

Efficient Computation of Combinational Circuits Reliability Based on Probabilistic Transfer Matrix

Lirida Alves de Barros Naviner , Kaikai Liu , Hao Cai , Jean-François Naviner
International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States
Conference papers hal-02412060v1

Analytical method for reliability assessment of concurrent checking circuits under multiple faults

Ting An , Kaikai Liu , Lirida Alves de Barros Naviner
MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Conference papers hal-02286867v1

Efficient reliability evaluation methodologies for combinational circuits

Hao Cai , Kaikai Liu , Lirida Alves de Barros Naviner , You Wang , Mariem Slimani , et al.
Microelectronics Reliability, 2016, 64
Journal articles hal-02287474v1
Image document

Reliability of probabilistic circuits

Kaikai Liu
Engineering Sciences [physics]. TELECOM ParisTech, 2014. English. ⟨NNT : ⟩
Theses tel-01208121v1

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An , Kaikai Liu , Hao Cai , Lirida Alves de Barros Naviner
Microelectronics Reliability, 2015, 55 (3-4), pp.696-703
Journal articles hal-01122423v1

A Study of Statistical Variability-aware Methods

Hao Cai , Kaikai Liu , Lirida Alves de Barros Naviner
IEEE International Symposium on Radio Frequency Integration Technology (RFIT), Aug 2014, Hefei, China
Conference papers hal-02286946v1