Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method - IMT - Institut Mines-Télécom Access content directly
Journal Articles Microelectronics Reliability Year : 2015
No file

Dates and versions

hal-01122423 , version 1 (03-03-2015)

Identifiers

  • HAL Id : hal-01122423 , version 1

Cite

Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩
73 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More