Journal Articles
Microelectronics Reliability
Year : 2015
Admin Télécom Paristech : Connect in order to contact the contributor
https://imt.hal.science/hal-01122423
Submitted on : Tuesday, March 3, 2015-6:44:02 PM
Last modification on : Thursday, September 21, 2023-12:06:05 PM
Dates and versions
Identifiers
- HAL Id : hal-01122423 , version 1
Cite
Ting An, Kaikai Liu, Hao Cai, Lirida Alves de Barros Naviner. Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method. Microelectronics Reliability, 2015, 55 (3-4), pp.696-703. ⟨hal-01122423⟩
Collections
73
View
0
Download