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authFullName_s : Ting An

Simulation Study of Aging in CMOS Binary Adders

Ting An , Hao Cai , Lirida Alves de Barros Naviner
MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Conference papers hal-02288395v1

Reliability analysis of combinational circuits with the influences of noise and single-event transients

Kaikai Liu , Hao Cai , Ting An , Lirida Alves de Barros Naviner , Jean-François Naviner , et al.
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States
Conference papers hal-02286814v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Alves de Barros Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers hal-00973765v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Alves de Barros Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers hal-00973766v1
Image document

Architectures of self-controllable digital operators

Ting An
Micro and nanotechnologies/Microelectronics. Télécom ParisTech, 2014. English. ⟨NNT : 2014ENST0054⟩
Theses tel-01366557v1

Transient Fault Analysis of CORDIC Processor

Ting An , Matteo Causo , Lirida Alves de Barros Naviner , Philippe Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers hal-00973764v1

Efficient Implementation for Accurate Analysis of CED Circuits Against Multiple Faults

Ting An , Kaikai Liu , Hao Cai , Lirida Alves de Barros Naviner
21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Conference papers hal-02286893v1

Exploring the Impact of Transient Faults on CORDIC Processor

Ting An , Lirida Alves de Barros Naviner , Philippe Matherat
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun 2013, Grenoble, France
Conference papers hal-02411992v1

Evaluation of Fault-tolerant Composite Field AES S-Boxes under Multiple Transient Faults

Ting An , Lirida Alves de Barros Naviner , Philippe Matherat
IEEE International NEWCAS Conference, Jun 2013, Paris, France. pp.1 - 4
Conference papers hal-00973720v1

Parallel Scaling-Free and Area-Time Efficient CORDIC Algorithm

Matteo Causo , Ting An , Lirida Alves de Barros Naviner
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.149 - 152
Conference papers hal-01024891v1

A General Cost-effective Design Structure for Probabilistic-Based Noise-Tolerant Logic Functions in Nanometer CMOS Technology

Kaikai Liu , Ting An , Hao Cai , Lirida Alves de Barros Naviner , Jean-François Naviner , et al.
Eurocon 2013, Jul 2013, Zagreb, Croatia. pp.1829-1836, ⟨10.1109/EUROCON.2013.6625225⟩
Conference papers hal-02286855v1

A Low Cost Reliable Architecture for S-Boxes in AES Processors

Ting An , Lirida Alves de Barros Naviner , Philippe Matherat
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, U.S. Outlying Islands. pp.155-160
Conference papers hal-01024892v1

Analytical method for reliability assessment of concurrent checking circuits under multiple faults

Ting An , Kaikai Liu , Lirida Alves de Barros Naviner
MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Conference papers hal-02286867v1

Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical Method

Ting An , Kaikai Liu , Hao Cai , Lirida Alves de Barros Naviner
Microelectronics Reliability, 2015, 55 (3-4), pp.696-703
Journal articles hal-01122423v1