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Simulation Study of Aging in CMOS Binary AddersMIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Conference papers
hal-02288395v1
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Reliability analysis of combinational circuits with the influences of noise and single-event transientsIEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States
Conference papers
hal-02286814v1
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Transient Fault Analysis of CORDIC ProcessorIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers
hal-00973765v1
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Transient Fault Analysis of CORDIC ProcessorIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers
hal-00973766v1
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Architectures of self-controllable digital operatorsMicro and nanotechnologies/Microelectronics. Télécom ParisTech, 2014. English. ⟨NNT : 2014ENST0054⟩
Theses
tel-01366557v1
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Transient Fault Analysis of CORDIC ProcessorIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.757 - 760
Conference papers
hal-00973764v1
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Efficient Implementation for Accurate Analysis of CED Circuits Against Multiple Faults21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland
Conference papers
hal-02286893v1
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Exploring the Impact of Transient Faults on CORDIC ProcessorJournées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun 2013, Grenoble, France
Conference papers
hal-02411992v1
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Evaluation of Fault-tolerant Composite Field AES S-Boxes under Multiple Transient FaultsIEEE International NEWCAS Conference, Jun 2013, Paris, France. pp.1 - 4
Conference papers
hal-00973720v1
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Parallel Scaling-Free and Area-Time Efficient CORDIC AlgorithmIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Séville, Spain. pp.149 - 152
Conference papers
hal-01024891v1
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A General Cost-effective Design Structure for Probabilistic-Based Noise-Tolerant Logic Functions in Nanometer CMOS TechnologyEurocon 2013, Jul 2013, Zagreb, Croatia. pp.1829-1836, ⟨10.1109/EUROCON.2013.6625225⟩
Conference papers
hal-02286855v1
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A Low Cost Reliable Architecture for S-Boxes in AES ProcessorsIEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, U.S. Outlying Islands. pp.155-160
Conference papers
hal-01024892v1
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Analytical method for reliability assessment of concurrent checking circuits under multiple faultsMIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia
Conference papers
hal-02286867v1
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Accurate Reliability Analysis of Concurrent Checking Circuits Employing An Efficient Analytical MethodMicroelectronics Reliability, 2015, 55 (3-4), pp.696-703
Journal articles
hal-01122423v1
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