Journal Articles
Microelectronics Reliability
Year : 2013
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https://imt.hal.science/hal-01062108
Submitted on : Tuesday, September 9, 2014-11:17:39 AM
Last modification on : Monday, October 9, 2023-12:49:41 PM
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- HAL Id : hal-01062108 , version 1
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Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Alves de Barros Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. Microelectronics Reliability, 2013, pp.1230-1234. ⟨hal-01062108⟩
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