SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults - IMT - Institut Mines-Télécom Access content directly
Conference Papers Year : 2013
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hal-01062078 , version 1 (09-09-2014)

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  • HAL Id : hal-01062078 , version 1

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Samuel Nascimento Pagliarini, Arwa Ben Dhia, Lirida Naviner, J. F. Naviner. SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234. ⟨hal-01062078⟩
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