@article{slimani:hal-01216729, TITLE = {{A Novel Analytical Method for Defect Tolerance Assessment}}, AUTHOR = {Slimani, Mariem and Ben Dhia, Arwa and Alves de Barros Naviner, Lirida}, URL = {https://imt.hal.science/hal-01216729}, JOURNAL = {{Microelectronics Reliability}}, HAL_LOCAL_REFERENCE = {MS:MRJ-15}, PUBLISHER = {{Elsevier}}, VOLUME = {55}, PAGES = {1285-1289}, YEAR = {2015}, MONTH = Oct, KEYWORDS = {Robustness ; defect modeling ; transistor-level ; gate-level ; stuck-at model}, HAL_ID = {hal-01216729}, HAL_VERSION = {v1}, }