Charge exchange 18O resonance 18O Nitridation Measurement Gold Alloy 7550Pp 17Op Low energy electron diffraction LEED RBS Magnetic semiconductors Indium oxide Energy loss HfO2 Periodic multilayer Thin films Atomic Layer Deposition ALD Isotopic Tracing Silica Aluminum Ion implantation Magnetization curves Nuclear resonance profiling NRP Nickel AFM 7630Lh Channeling Hysteresis XRD Gallium oxide Topological insulators Photoluminescence ALD PIXE 2H 13C Diffusion ADSORPTION DESORPTION HYSTERESIS Pulsed laser deposition Passivation Acoustic propreties of solid Rutherford backscattering spectrometry RBS 8140Ef GaMnAs Density functional theory Alloys Aluminium Silicon carbide Epitaxy 7550Ee Topological defects NRP Epitaxial growth Pb centers 27Ald p&α AC susceptibility Ferromagnetic resonance Ion beam analysis Defects EPR Adsorption Isotherms Stable isotopic tracing SiC Ageing 6855Jk Metal-insulator transition 15N Silicon Carbide Interface defects 27Aldp Silicon Nuclear reaction analysis Growth Acoustic Auger electron spectroscopy AES Annealing Adsorption Magnetic anisotropy Nanoparticles Raman spectroscopy Oxygen deficiency Evaluation Multilayer 3C-SiC 27Alda Sputtering Oxidation X-ray diffraction Thin film Capillary condensation Al2O3 17Opp Zinc oxide XPS 17O Adsorbed layers Nanostructures Transparent conductive oxide TCO Kossel diffraction